11-042/2 - Observation Driven Mixed-Measurement Dynamic Factor Models with an Application to Credit Risk
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AuthorsDrew Creal, University of Chicago, Booth School of Business; Bernd Schwaab, European Central Bank; Siem Jan Koopman, VU University Amsterdam; Andre Lucas, VU University Amsterdam
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Publication dateFebruary 21, 2011
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Keywordspanel data, loss given default, default risk, dynamic beta density, dynamic ordered probit, dynamic factor model
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JELC32, G32